Luca Daniel

Collaborators

  • E. Adalsteinsson, MIT HST
  • D. Boning, MIT EECS
  • G. Calafiore, Politec di Torino
  • A. Elfadel, Masdar Univ.
  • E. Demircan, Freescale
  • S. Grivet, Politec. di Torino
  • A. Hochman, Ansys
  • M. Kamon, Coventor
  • M. Kozlov, Max Planck Inst.
  • P. Maffezzoni, Politec. di Milano
  • R. Marathe, MIT EECS
  • A. Megretski, MIT EECS
  • T. El Moselhy, MIT AeroAstro
  • F. Pappalardo, STmicroelectronics
  • I. Oseledets, INM Moscow
  • S. Rinaldo, STmicroelectronics
  • S. Rusakov, IPPM RAS Moscow
  • M. Silveira, Univ. of Lisbon
  • R. Suaya, Mentor Graphics
  • P. Triverio, Univ. of Toronto
  • K. Turitsyn, MIT Mech Eng.
  • Y. Vassileski, INM Moscow
  • L. Wald, MGH Harvard
  • D. Wenstein, MIT EECS
  • M. Watts, MIT EECS
  • J. White, MIT EECS.
  • N. Wong, Univ of Hong Kong
  • M.Eng Students
  • M. Rybak, MIT EECS

Graduate Students

  • B. Bahr, (main advis: Wenstein)
  • Y. Hsiao, MIT EECS
  • Z. Mahmood, MIT EECS
  • Z. Zhang, MIT EECS

Postdoctoral Associates

  • N. Farnoosh, MIT
  • S. Chadarghadr, MIT
  • J. Villena, MIT

Research scientists

  • T. Klemas, MIT and Lincoln Labs
  • M. Kamon, MIT and Coventor

Support Staff

  • C. Collins, Admin. Asst.

Publications

Z. Mahmood, R. Suaya, L. Daniel, “An Efficient Framework for Passive Compact Dynamical Modeling of Multiport Linear Systems”, (Accepted) Proc. of Design Automation & Test in Europe (DATE), Dresden, Germany 2012.

Z. Zhang, M. Kamon and L. Daniel, “Continuation-based pull-in and lift-off simulation for micro-electro-mechanical system (MEMS) design”,  SRC TECHCON, Austin, TX, Sept. 2012.

Z. Mahmood, L. Daniel “Compact Parameterized Modeling of RF Nano-Electro-Mechanical (NEM) Resonators”, SRC TECHCON, Austin, TX, Sept. 2012.

R. Marathe, D. Weinstein, R. Suaya and L. Daniel, “Automated Parameterized Dynamical Modeling of RF MEMS Resonators” TECHCON, Austin, TX, Sept. 2012.

R Marathe, W Wang, Z Mahmood, L Daniel, D Weinstein: Resonant Body Transistors in IBM’s 32nm SOI CMOS technology. Proc of IEEE SOI 2012 Conference, California,USA, October 2012.

Z Mahmood and L Daniel, Passivity-preserving Algorithm for Multiport Parameterized Modeling in the Frequency Domain, In the proceedings of SIAM CSE 2013, Boston March 2013.

Hsiao, Y.-C., and Daniel, L. Real-time Local Capacitance Extraction at Field-solver Accuracy Using Instantiable Basis Functions with Boundary Element Methods, In proc of the 33rd PIERS conference in Taipei, Taiwan, March, 2013

Z. Mahmood, B. Guerin, E. Adalsteinsson, L. Wald, L. Daniel, “An Automated Framework to Decouple pTx Arrays with Many Channels”, ISMRM, April 2013, Salt Lake City, Utah.

J. Villena, A. Hochman, M. Silveira, E. Adalsteinsson, L. Wald, J. White, L. Daniel. Pre-computed Green’s Functions for Fast Electromagnetic Simulation with Realistic Human Body Models. International Society for Magnetic Resonance”,  ISMRM, April 2013, Salt Lake City, Utah.

A. Hochman, J. Villena, M. Silveira, E. Adalsteinsson, L. Wald, J. White, L. Daniel. A Fast Sampled Projection Method for Assessing Coil Configuration impact on SAR.” ISMRM, April 2013, Salt Lake City, Utah.

L. Daniel, “Using Parameterized Model Order Reduction for Simulation, Modeling and Optimization of Dynamical Systems Networks”, Cardiovascular Simulation, Challenges and Prospective Workshop, Univ. of Houston, April 2013.

Z. Mahmood, A. Chinea, G. Calafiore, S. Grivet-Talocia, L. Daniel, “Robust Localization Methods for Passivity Enforcement of Linear Macromodels”, IEEE workshop on Signal and Power Integrity Paris France, May 2013.

L. Daniel, “Uncertainty Quantification Techniques for On-Chip and Off-Chip Stochastic 3D Modeling of Interconnect”, IEEE workshop on Signal and Power Integrity Paris France, May 2013.

M. Kamon, S. Maity, D. Dereus, Z. Zhang, S. Cunningham, S. Kim, J. McKillop, A. Morris, G. Lorenz and L. Daniel, “New simulation and experimental methodology for analyzing pull-in and release in MEMS switches,” Transducers, Barcelona, Spain, June, 2013.

Z. Zhang, T. El-Moselhy, I. M. Elfadel and L. Daniel, “Stochastic testing method for transistor-level uncertainty quantification based on generalized polynomial chaos,” IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems, 13 pages, accepted for publication.