Duane S. Boning

  • Title: Professor
  • Department: Department of Electrical Engineering and Computer Science

Collaborators

  • A, Elfadel, Masdar Institute
  • A. Philipossian, Univ. of Arizona
  • H. Taylor, NTU, Singapore

Graduate Students

  • H. Boo, Res. Asst., EECS
  • A. Chang, Res. Asst., EECS
  • W. Fan, Res. Asst., EECS
  • J. Lee, Res. Asst., EECS
  • J. Johnson, Res. Asst., EECS
  • L. Yu, Res. Asst., EECS

Support Staff

  • G. Lindsay, Admin. Asst. II

Publications

W. Zhang, K. Balakrishnan, X. Li, D. Boning, E. Acar, F. Liu, and R. A. Rutenbar, “Spatial Variation Decomposition via Sparse Regression,” International Conference on IC Design and Technology (ICICDT), Austin, TX, May 2012.

J. M. Johnson, D. S. Boning, G.-S. Kim, P. Safier, K. Knutson, R. Mudhivarthi, and K. Pate, “Slurry Abrasive Particle Agglomeration Experimentation and Modeling for Chemical Mechanical Planarization (CMP),” International Conference on Planarization Technology (ICPT), Grenoble, France, Oct. 2012.

L. Yu, O. Mysore, L. Wei, L. Daniel, D. A. Antoniadis, I. Elfadel, and D. Boning, “Virtual Source MOSFET Model: Parameter Extraction, Statistical Modeling and Application,” submitted to IEEE/ACM Workshop on Variability Modeling and Characterization (VMC), Santa Clara, CA, Nov. 2012.

L. Yu, O. Mysore, L. Wei, L. Daniel, D. A. Antoniadis, I. Elfadel, and D. Boning, “An Ultra-Compact Virtual Source FET Model for Deeply-Scaled Devices: Parameter Extraction and Validation for Standard Cell Libraries and Digital Circuits,” 18th Asia and South Pacific Design Automation Conferences (ASP-DAC), Yokohama, Japan, Jan. 2013.

W. Zhang, K. Balakrishnan, X. Li, D. Boning, S. Saxena, A. Strojwas, and R. A. Rutenbar, “Efficient Spatial Pattern Analysis for Variation Decomposition via Robust Sparse Regression,” IEEE Trans. on Computer-Aided Design, vol. 32, no. 7, pp. 1072-1085, Jan. 2013.

A. Chang, H.-S. Lee, and D. Boning, “A 12b 50MS/s 2.1mW SAR ADC with Redundancy and Digital Background Calibration,” Student Research Preview, IEEE International Solid-State Circuits Conference (ISSCC), Feb. 2013.

L. Yu, O. Mysore, L. Wei, L. Daniel, D. A. Antoniadis, I. Elfadel, and D. Boning, “Statistical Modeling with the Virtual Source MOSFET Model,” Design, Automation & Test in Europe (DATE), Grenoble, France, March 2013.

Faculty & Topics