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Annual Research Report 2002
Modeling and Simulation
Integrated Chip-Scale Simulation of Pattern Dependencies in Copper Electroplating and Chemical Mechanical Polishing Processes
Modeling of CMP and Nanotopography Interactions
Cu Gettering Studies in Silicon
Multiscale Simulations of Thin Film Deposition Processes
Modeling of Advanced Devices
Experimental Investigation of Carrier Velocity and Mobility in Deeply Scaled MOSFETs