{"id":1892,"date":"2013-08-14T16:34:02","date_gmt":"2013-08-14T16:34:02","guid":{"rendered":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/?p=1892"},"modified":"2013-08-14T16:52:45","modified_gmt":"2013-08-14T16:52:45","slug":"hae-seung-lee","status":"publish","type":"post","link":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/hae-seung-lee\/","title":{"rendered":"Hae-Seung Lee"},"content":{"rendered":"<h3>Graduate Students<\/h3>\n<ul>\n<li>Hyun Ho Boo, Research Assistant, EECS<\/li>\n<li>Albert Chang, Research Assistant, EECS<\/li>\n<li>Sushmit Goswami, Research Assistant, EECS<\/li>\n<li>Daniel Kumar, Research Assistant, EECS<\/li>\n<li>Sunghyuk Lee, Research Assistant, EECS<\/li>\n<li>Mariana Markova, Research Assistant, EECS<\/li>\n<li>Sabino Pietrangelo, Research Assistant, EECS<\/li>\n<li>Joohyun Seo, Research Assistant, EECS<\/li>\n<li>Do Yeon Yoon, Research Assistant, EECS<\/li>\n<li>Xi Yang, Research Assistant, EECS<\/li>\n<\/ul>\n<h3>Visiting Scientists<\/h3>\n<ul>\n<li>Doeg-Kyoon Jeong, Professor, Seoul National University<\/li>\n<li>Shumpei Ida, Murata Manufacturing Co., Ltd.<\/li>\n<\/ul>\n<h3>Support Staff<\/h3>\n<ul>\n<li>Carolyn Collins, Assistant to Director of Center for Integrated Circuits and Systems<\/li>\n<\/ul>\n<h3>Publications<\/h3>\n<p>S. Lee,\u00a0 A. Chandrakasan, and H.-S. Lee, \u201cA Voltage Scalable Zero-Crossing Based Pipelined ADC,\u201d <em>IEEE J. Solid-State Circuits<\/em>, vol. SC-47, pp. 1603-1614, July 2012<\/p>\n<p>S. Shin, J.C. Rudell, D.C. Daly, C.E. Munoz, D.Y. Chang, K. Gulati, H.-S. Lee, and M.Z. Straayer, \u201cA 12b 200MS\/s frequency scalable zero-crossing based pipelined ADC in 55nm CMOS,\u201d <em>IEEE Custom Integrated Circuits Conference<\/em>, San Jose, CA, September, 2012<\/p>\n<p>N. Sun, H.-S. Lee, and D. Ham, \u201cA 2.9-mW 11-b 20-MS\/s pipelined ADC with dual-mode-based digital background calibration,\u201d P<em>roceedings of European Solid-State Circuits Conference<\/em>, \u00a0Bordeaux, France, September, 2012.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Analog and mixed-signal integrated circuits, with  a particular emphasis in data conversion circuits in scaled CMOS.  <\/p>\n","protected":false},"author":370,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[80],"tags":[21],"_links":{"self":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/posts\/1892"}],"collection":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/users\/370"}],"replies":[{"embeddable":true,"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/comments?post=1892"}],"version-history":[{"count":6,"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/posts\/1892\/revisions"}],"predecessor-version":[{"id":2476,"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/posts\/1892\/revisions\/2476"}],"wp:attachment":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/media?parent=1892"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/categories?post=1892"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/tags?post=1892"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}