{"id":1832,"date":"2013-08-14T00:10:13","date_gmt":"2013-08-14T00:10:13","guid":{"rendered":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/?p=1832"},"modified":"2013-08-14T16:40:27","modified_gmt":"2013-08-14T16:40:27","slug":"duane-s-boning","status":"publish","type":"post","link":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/duane-s-boning\/","title":{"rendered":"Duane S. Boning"},"content":{"rendered":"<h3>Collaborators<\/h3>\n<ul>\n<li>A, Elfadel, Masdar Institute<\/li>\n<li>A. Philipossian, Univ. of Arizona<\/li>\n<li>H. Taylor, NTU, Singapore<\/li>\n<\/ul>\n<h3>Graduate Students<\/h3>\n<ul>\n<li>H. Boo, Res. Asst., EECS<\/li>\n<li>A. Chang, Res. Asst., EECS<\/li>\n<li>W. Fan, Res. Asst., EECS<\/li>\n<li>J. Lee, Res. Asst., EECS<\/li>\n<li>J. Johnson, Res. Asst., EECS<\/li>\n<li>L. Yu, Res. Asst., EECS<\/li>\n<\/ul>\n<h3>Support Staff<\/h3>\n<ul>\n<li>G. Lindsay, Admin. Asst. II<\/li>\n<\/ul>\n<h3>Publications<\/h3>\n<p>W. Zhang, K. Balakrishnan, X. Li, D. Boning, E. Acar, F. Liu, and R. A. Rutenbar, \u201cSpatial Variation Decomposition via Sparse Regression,\u201d <em>International Conference on IC Design and Technology (ICICDT)<span style=\"text-decoration: underline;\">,<\/span><\/em> Austin, TX, May 2012.<\/p>\n<p align=\"left\">J. M. Johnson, D. S. Boning, G.-S. Kim, P. Safier, K. Knutson, R. Mudhivarthi, and K. Pate, \u201cSlurry Abrasive Particle Agglomeration Experimentation and Modeling for Chemical Mechanical Planarization (CMP),\u201d <em>International Conference on Planarization Technology (ICPT)<span style=\"text-decoration: underline;\">,<\/span><\/em> Grenoble, France, Oct. 2012.<\/p>\n<p align=\"left\">L. Yu, O. Mysore, L. Wei, L. Daniel, D. A. Antoniadis, I. Elfadel, and D. Boning, \u201cVirtual Source MOSFET Model: Parameter Extraction, Statistical Modeling and Application,\u201d submitted to <em>IEEE\/ACM Workshop on Variability Modeling and Characterization (VMC)<span style=\"text-decoration: underline;\">,<\/span><\/em> Santa Clara, CA, Nov. 2012.<\/p>\n<p align=\"left\">L. Yu, O. Mysore, L. Wei, L. Daniel, D. A. Antoniadis, I. Elfadel, and D. Boning, \u201cAn Ultra-Compact Virtual Source FET Model for Deeply-Scaled Devices: Parameter Extraction and Validation for Standard Cell Libraries and Digital Circuits,\u201d <em>18<sup>th<\/sup> Asia and South Pacific Design Automation Conferences (ASP-DAC)<\/em>, Yokohama, Japan, Jan. 2013.<\/p>\n<p align=\"left\">W. Zhang, K. Balakrishnan, X. Li, D. Boning, S. Saxena, A. Strojwas, and R. A. Rutenbar, \u201cEfficient Spatial Pattern Analysis for Variation Decomposition via Robust Sparse Regression,\u201d <em>IEEE Trans. on Computer-Aided Design<\/em>, vol. 32, no. 7, pp. 1072-1085, Jan. 2013.<\/p>\n<p align=\"left\">A. Chang, H.-S. Lee, and D. Boning, \u201cA 12b 50MS\/s 2.1mW SAR ADC with Redundancy and Digital Background Calibration,\u201d Student Research Preview, <em>IEEE International Solid-State Circuits Conference (ISSCC)<\/em>, Feb. 2013.<\/p>\n<p align=\"left\">L. Yu, O. Mysore, L. Wei, L. Daniel, D. A. Antoniadis, I. Elfadel, and D. Boning, \u201cStatistical Modeling with the Virtual Source MOSFET Model,\u201d <em>Design, Automation &amp; Test in Europe (DATE)<span style=\"text-decoration: underline;\">,<\/span><\/em> Grenoble, France, March 2013.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Design for manufacturability (DFM) of processes, devices, and integrated circuits. Characterization and modeling of variation in semiconductor and MEMS manufacturing, with emphasis on chemical-mechanical polishing (CMP), electroplating, plasma etch, and embossing processes. Statistical modeling of spatial and operating variation in advanced devices and circuits.<\/p>\n","protected":false},"author":370,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[80],"tags":[44],"_links":{"self":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/posts\/1832"}],"collection":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/users\/370"}],"replies":[{"embeddable":true,"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/comments?post=1832"}],"version-history":[{"count":2,"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/posts\/1832\/revisions"}],"predecessor-version":[{"id":1834,"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/posts\/1832\/revisions\/1834"}],"wp:attachment":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/media?parent=1832"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/categories?post=1832"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/tags?post=1832"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}