{"id":941,"date":"2013-06-27T19:36:45","date_gmt":"2013-06-27T19:36:45","guid":{"rendered":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/files\/2013\/06\/jin_ganpowerswitching_02.jpg"},"modified":"2013-06-27T19:36:45","modified_gmt":"2013-06-27T19:36:45","slug":"jin_ganpowerswitching_02","status":"inherit","type":"attachment","link":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/reliability-of-gan-mis-hemts-for-power-switching-applications\/jin_ganpowerswitching_02\/","title":{"rendered":"Figure 2"},"author":370,"comment_status":"closed","ping_status":"closed","template":"","meta":[],"description":{"rendered":"

\"\"<\/a><\/p>\n"},"caption":{"rendered":"

Figure 2: Time evolution of source (IS), gate (IG), drain (ID), substrate (IB) leakage currents in the stress periods of Figure 1. As the OFF-state bias increases, the drain-to-substrate leakage current also increases with a minor increase in the source current. The gate leakage current is stable, presumably due to the robust MIS structure and field plate engineering. <\/p>\n"},"alt_text":"","media_type":"image","mime_type":"image\/jpeg","media_details":{"width":805,"height":574,"file":"2013\/06\/jin_ganpowerswitching_02.jpg","sizes":{"thumbnail":{"file":"jin_ganpowerswitching_02-150x150.jpg","width":150,"height":150,"mime_type":"image\/jpeg","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/jin_ganpowerswitching_02-150x150.jpg"},"medium":{"file":"jin_ganpowerswitching_02-300x213.jpg","width":300,"height":213,"mime_type":"image\/jpeg","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/jin_ganpowerswitching_02-300x213.jpg"},"post-thumbnail":{"file":"jin_ganpowerswitching_02-150x150.jpg","width":150,"height":150,"mime_type":"image\/jpeg","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/jin_ganpowerswitching_02-150x150.jpg"},"abstract-thumb":{"file":"jin_ganpowerswitching_02-220x156.jpg","width":220,"height":156,"mime_type":"image\/jpeg","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/jin_ganpowerswitching_02-220x156.jpg"},"full":{"file":"jin_ganpowerswitching_02.jpg","width":805,"height":574,"mime_type":"image\/jpeg","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/jin_ganpowerswitching_02.jpg"}},"image_meta":{"aperture":0,"credit":"","camera":"","caption":"","created_timestamp":0,"copyright":"","focal_length":0,"iso":0,"shutter_speed":0,"title":""}},"post":938,"source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/jin_ganpowerswitching_02.jpg","_links":{"self":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/media\/941"}],"collection":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/media"}],"about":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/types\/attachment"}],"author":[{"embeddable":true,"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/users\/370"}],"replies":[{"embeddable":true,"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/comments?post=941"}]}}