{"id":940,"date":"2013-06-27T19:36:44","date_gmt":"2013-06-27T19:36:44","guid":{"rendered":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/files\/2013\/06\/jin_ganpowerswitching_01.jpg"},"modified":"2013-06-27T19:36:44","modified_gmt":"2013-06-27T19:36:44","slug":"jin_ganpowerswitching_01","status":"inherit","type":"attachment","link":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/reliability-of-gan-mis-hemts-for-power-switching-applications\/jin_ganpowerswitching_01\/","title":{"rendered":"Figure 1"},"author":370,"comment_status":"closed","ping_status":"closed","template":"","meta":[],"description":{"rendered":"<p class=\"attachment\"><a href='https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/jin_ganpowerswitching_01.jpg' rel=\"lightbox[940]\"><img width=\"300\" height=\"225\" src=\"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/jin_ganpowerswitching_01-300x225.jpg\" class=\"attachment-medium size-medium\" alt=\"\" loading=\"lazy\" srcset=\"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/jin_ganpowerswitching_01-300x225.jpg 300w, https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/jin_ganpowerswitching_01-220x165.jpg 220w, https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/jin_ganpowerswitching_01.jpg 686w\" sizes=\"(max-width: 300px) 100vw, 300px\" \/><\/a><\/p>\n"},"caption":{"rendered":"<p>Figure 1: Time evolution of RON\/RON(0) in the OFF-state step-stress-recovery experiment in GaN MIS-HEMTs. VDS is step-stressed from 50 V to 600 V in 50 V steps and 150-sec stress periods. A 150-sec recovery period follows each stress period. Electron trapping during the high-voltage OFF-state operation induces significant but slowly recoverable RON degradation.   <\/p>\n"},"alt_text":"","media_type":"image","mime_type":"image\/jpeg","media_details":{"width":686,"height":515,"file":"2013\/06\/jin_ganpowerswitching_01.jpg","sizes":{"thumbnail":{"file":"jin_ganpowerswitching_01-150x150.jpg","width":150,"height":150,"mime_type":"image\/jpeg","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/jin_ganpowerswitching_01-150x150.jpg"},"medium":{"file":"jin_ganpowerswitching_01-300x225.jpg","width":300,"height":225,"mime_type":"image\/jpeg","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/jin_ganpowerswitching_01-300x225.jpg"},"post-thumbnail":{"file":"jin_ganpowerswitching_01-150x150.jpg","width":150,"height":150,"mime_type":"image\/jpeg","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/jin_ganpowerswitching_01-150x150.jpg"},"abstract-thumb":{"file":"jin_ganpowerswitching_01-220x165.jpg","width":220,"height":165,"mime_type":"image\/jpeg","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/jin_ganpowerswitching_01-220x165.jpg"},"full":{"file":"jin_ganpowerswitching_01.jpg","width":686,"height":515,"mime_type":"image\/jpeg","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/jin_ganpowerswitching_01.jpg"}},"image_meta":{"aperture":0,"credit":"","camera":"","caption":"","created_timestamp":0,"copyright":"","focal_length":0,"iso":0,"shutter_speed":0,"title":""}},"post":938,"source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/jin_ganpowerswitching_01.jpg","_links":{"self":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/media\/940"}],"collection":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/media"}],"about":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/types\/attachment"}],"author":[{"embeddable":true,"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/users\/370"}],"replies":[{"embeddable":true,"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/comments?post=940"}]}}