{"id":899,"date":"2013-06-26T18:34:28","date_gmt":"2013-06-26T18:34:28","guid":{"rendered":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/files\/2013\/06\/bagnall_figure2.png"},"modified":"2013-06-26T18:34:28","modified_gmt":"2013-06-26T18:34:28","slug":"bagnall_figure2-2","status":"inherit","type":"attachment","link":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/device-level-thermal-analysis-of-gan-based-electronics\/bagnall_figure2-2\/","title":{"rendered":"Figure 2"},"author":370,"comment_status":"closed","ping_status":"closed","template":"","meta":[],"description":{"rendered":"<p class=\"attachment\"><a href='https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/bagnall_figure2.png' rel=\"lightbox[899]\"><img width=\"242\" height=\"169\" src=\"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/bagnall_figure2.png\" class=\"attachment-medium size-medium\" alt=\"\" loading=\"lazy\" srcset=\"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/bagnall_figure2.png 242w, https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/bagnall_figure2-220x153.png 220w\" sizes=\"(max-width: 242px) 100vw, 242px\" \/><\/a><\/p>\n"},"caption":{"rendered":"<p>Figure 2: Temperature distribution along the centerline of multi-finger GaN HEMT for RF power amplifier applications. Plot shows a comparison between a non-linear FEA model and an analytical model with the new Kirchhoff transform extension.<\/p>\n"},"alt_text":"","media_type":"image","mime_type":"image\/png","media_details":{"width":242,"height":169,"file":"2013\/06\/bagnall_figure2.png","sizes":{"thumbnail":{"file":"bagnall_figure2-150x150.png","width":150,"height":150,"mime_type":"image\/png","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/bagnall_figure2-150x150.png"},"post-thumbnail":{"file":"bagnall_figure2-150x150.png","width":150,"height":150,"mime_type":"image\/png","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/bagnall_figure2-150x150.png"},"abstract-thumb":{"file":"bagnall_figure2-220x153.png","width":220,"height":153,"mime_type":"image\/png","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/bagnall_figure2-220x153.png"},"full":{"file":"bagnall_figure2.png","width":242,"height":169,"mime_type":"image\/png","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/bagnall_figure2.png"}},"image_meta":{"aperture":0,"credit":"","camera":"","caption":"","created_timestamp":0,"copyright":"","focal_length":0,"iso":0,"shutter_speed":0,"title":""}},"post":895,"source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/bagnall_figure2.png","_links":{"self":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/media\/899"}],"collection":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/media"}],"about":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/types\/attachment"}],"author":[{"embeddable":true,"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/users\/370"}],"replies":[{"embeddable":true,"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/comments?post=899"}]}}