{"id":898,"date":"2013-06-26T18:34:27","date_gmt":"2013-06-26T18:34:27","guid":{"rendered":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/files\/2013\/06\/bagnall_figure1.png"},"modified":"2013-06-26T18:34:27","modified_gmt":"2013-06-26T18:34:27","slug":"bagnall_figure1-2","status":"inherit","type":"attachment","link":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/device-level-thermal-analysis-of-gan-based-electronics\/bagnall_figure1-2\/","title":{"rendered":"Figure 1"},"author":370,"comment_status":"closed","ping_status":"closed","template":"","meta":[],"description":{"rendered":"<p class=\"attachment\"><a href='https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/bagnall_figure1.png' rel=\"lightbox[898]\"><img width=\"248\" height=\"169\" src=\"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/bagnall_figure1.png\" class=\"attachment-medium size-medium\" alt=\"\" loading=\"lazy\" srcset=\"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/bagnall_figure1.png 248w, https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/bagnall_figure1-220x149.png 220w\" sizes=\"(max-width: 248px) 100vw, 248px\" \/><\/a><\/p>\n"},"caption":{"rendered":"<p>Figure 1: Heat source distribution along the channel for AlGaN HEMT under DC bias (VG = -2 V, VD = 50 V, Ploss ~ 4 W\/mm) obtained from Silvaco electro-thermal modeling.<\/p>\n"},"alt_text":"","media_type":"image","mime_type":"image\/png","media_details":{"width":248,"height":169,"file":"2013\/06\/bagnall_figure1.png","sizes":{"thumbnail":{"file":"bagnall_figure1-150x150.png","width":150,"height":150,"mime_type":"image\/png","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/bagnall_figure1-150x150.png"},"post-thumbnail":{"file":"bagnall_figure1-150x150.png","width":150,"height":150,"mime_type":"image\/png","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/bagnall_figure1-150x150.png"},"abstract-thumb":{"file":"bagnall_figure1-220x149.png","width":220,"height":149,"mime_type":"image\/png","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/bagnall_figure1-220x149.png"},"full":{"file":"bagnall_figure1.png","width":248,"height":169,"mime_type":"image\/png","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/bagnall_figure1.png"}},"image_meta":{"aperture":0,"credit":"","camera":"","caption":"","created_timestamp":0,"copyright":"","focal_length":0,"iso":0,"shutter_speed":0,"title":""}},"post":895,"source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/bagnall_figure1.png","_links":{"self":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/media\/898"}],"collection":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/media"}],"about":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/types\/attachment"}],"author":[{"embeddable":true,"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/users\/370"}],"replies":[{"embeddable":true,"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/comments?post=898"}]}}