{"id":721,"date":"2013-06-24T22:28:43","date_gmt":"2013-06-24T22:28:43","guid":{"rendered":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/files\/2013\/06\/hsiao_caplet01.png"},"modified":"2013-06-24T22:28:43","modified_gmt":"2013-06-24T22:28:43","slug":"hsiao_caplet01","status":"inherit","type":"attachment","link":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/caplet-field-solver-accurate-real-time-capacitance-extraction-toolkit-using-instantiable-basis-functions\/hsiao_caplet01\/","title":{"rendered":"Figure 1"},"author":370,"comment_status":"closed","ping_status":"closed","template":"","meta":[],"description":{"rendered":"

\"\"<\/a><\/p>\n"},"caption":{"rendered":"

Figure 1: (a) Charge distribution represented by 572 piecewise constant basis functions (left) and 17 instantiable basis functions (right). Capacitance errors for both cases are 2% w.r.t. a reference capacitance value extracted by standard BEM with fine discretization. (b) CAPLET GUI and NAND gate visualization.<\/p>\n"},"alt_text":"","media_type":"image","mime_type":"image\/png","media_details":{"width":1008,"height":1284,"file":"2013\/06\/hsiao_caplet01.png","sizes":{"thumbnail":{"file":"hsiao_caplet01-150x150.png","width":150,"height":150,"mime_type":"image\/png","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/hsiao_caplet01-150x150.png"},"medium":{"file":"hsiao_caplet01-235x300.png","width":235,"height":300,"mime_type":"image\/png","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/hsiao_caplet01-235x300.png"},"large":{"file":"hsiao_caplet01-803x1024.png","width":803,"height":1024,"mime_type":"image\/png","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/hsiao_caplet01-803x1024.png"},"post-thumbnail":{"file":"hsiao_caplet01-150x150.png","width":150,"height":150,"mime_type":"image\/png","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/hsiao_caplet01-150x150.png"},"abstract-thumb":{"file":"hsiao_caplet01-172x220.png","width":172,"height":220,"mime_type":"image\/png","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/hsiao_caplet01-172x220.png"},"full":{"file":"hsiao_caplet01.png","width":1008,"height":1284,"mime_type":"image\/png","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/hsiao_caplet01.png"}},"image_meta":{"aperture":0,"credit":"","camera":"","caption":"","created_timestamp":0,"copyright":"","focal_length":0,"iso":0,"shutter_speed":0,"title":""}},"post":718,"source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/06\/hsiao_caplet01.png","_links":{"self":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/media\/721"}],"collection":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/media"}],"about":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/types\/attachment"}],"author":[{"embeddable":true,"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/users\/370"}],"replies":[{"embeddable":true,"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/comments?post=721"}]}}