{"id":2340,"date":"2013-08-05T17:57:18","date_gmt":"2013-08-05T17:57:18","guid":{"rendered":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/files\/2013\/07\/lu_fets_02b.png"},"modified":"2013-08-05T17:57:18","modified_gmt":"2013-08-05T17:57:18","slug":"lu_fets_02b","status":"inherit","type":"attachment","link":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/nano-scale-metal-contacts-for-iii-v-fets\/lu_fets_02b\/","title":{"rendered":"Figure 2"},"author":370,"comment_status":"closed","ping_status":"closed","template":"","meta":[],"description":{"rendered":"

\"\"<\/a><\/p>\n"},"caption":{"rendered":"

Figure 2: Experimental nano-TLM resistance of test structures with average contact length of 80 nm. The values of \u03c1c, Rsh, and Rshm are extracted by the 2D nano-TLM model. The insets show the two configurations in the Kelvin measurements. <\/p>\n"},"alt_text":"","media_type":"image","mime_type":"image\/png","media_details":{"width":1125,"height":809,"file":"2013\/07\/lu_fets_02b.png","sizes":{"thumbnail":{"file":"lu_fets_02b-150x150.png","width":150,"height":150,"mime_type":"image\/png","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/07\/lu_fets_02b-150x150.png"},"medium":{"file":"lu_fets_02b-300x215.png","width":300,"height":215,"mime_type":"image\/png","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/07\/lu_fets_02b-300x215.png"},"large":{"file":"lu_fets_02b-1024x736.png","width":1024,"height":736,"mime_type":"image\/png","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/07\/lu_fets_02b-1024x736.png"},"post-thumbnail":{"file":"lu_fets_02b-150x150.png","width":150,"height":150,"mime_type":"image\/png","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/07\/lu_fets_02b-150x150.png"},"abstract-thumb":{"file":"lu_fets_02b-220x158.png","width":220,"height":158,"mime_type":"image\/png","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/07\/lu_fets_02b-220x158.png"},"full":{"file":"lu_fets_02b.png","width":1125,"height":809,"mime_type":"image\/png","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/07\/lu_fets_02b.png"}},"image_meta":{"aperture":0,"credit":"","camera":"","caption":"","created_timestamp":0,"copyright":"","focal_length":0,"iso":0,"shutter_speed":0,"title":""}},"post":1116,"source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/07\/lu_fets_02b.png","_links":{"self":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/media\/2340"}],"collection":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/media"}],"about":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/types\/attachment"}],"author":[{"embeddable":true,"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/users\/370"}],"replies":[{"embeddable":true,"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/comments?post=2340"}]}}