{"id":1229,"date":"2013-07-01T14:12:27","date_gmt":"2013-07-01T14:12:27","guid":{"rendered":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/files\/2013\/07\/yu_modeling_02.jpg"},"modified":"2013-07-01T14:12:27","modified_gmt":"2013-07-01T14:12:27","slug":"yu_modeling_02","status":"inherit","type":"attachment","link":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/statistical-modeling-with-the-virtual-source-mosfet-model\/yu_modeling_02\/","title":{"rendered":"Figure 2"},"author":370,"comment_status":"closed","ping_status":"closed","template":"","meta":[],"description":{"rendered":"

\"\"<\/a><\/p>\n"},"caption":{"rendered":"

Figure 2: Delay probability density comparison between BSIM and VS model for an NAND2 gate (fanout of 3) with a supply voltage of (a) 0.9V, (b) 0.7V and (c) 0.55V. The quantile-quantile plot for delay variation under each
\nsupply voltage in (d) 0.9V, (e) 0.7V and (f) 0.55V shows a strongly nonlinear
\npattern in low-power application.<\/p>\n"},"alt_text":"","media_type":"image","mime_type":"image\/jpeg","media_details":{"width":481,"height":322,"file":"2013\/07\/yu_modeling_02.jpg","sizes":{"thumbnail":{"file":"yu_modeling_02-150x150.jpg","width":150,"height":150,"mime_type":"image\/jpeg","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/07\/yu_modeling_02-150x150.jpg"},"medium":{"file":"yu_modeling_02-300x200.jpg","width":300,"height":200,"mime_type":"image\/jpeg","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/07\/yu_modeling_02-300x200.jpg"},"post-thumbnail":{"file":"yu_modeling_02-150x150.jpg","width":150,"height":150,"mime_type":"image\/jpeg","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/07\/yu_modeling_02-150x150.jpg"},"abstract-thumb":{"file":"yu_modeling_02-220x147.jpg","width":220,"height":147,"mime_type":"image\/jpeg","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/07\/yu_modeling_02-220x147.jpg"},"full":{"file":"yu_modeling_02.jpg","width":481,"height":322,"mime_type":"image\/jpeg","source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/07\/yu_modeling_02.jpg"}},"image_meta":{"aperture":0,"credit":"","camera":"","caption":"","created_timestamp":0,"copyright":"","focal_length":0,"iso":0,"shutter_speed":0,"title":""}},"post":1225,"source_url":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-content\/blogs.dir\/22\/files\/2013\/07\/yu_modeling_02.jpg","_links":{"self":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/media\/1229"}],"collection":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/media"}],"about":[{"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/types\/attachment"}],"author":[{"embeddable":true,"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/users\/370"}],"replies":[{"embeddable":true,"href":"https:\/\/mtlsites.mit.edu\/annual_reports\/2013\/wp-json\/wp\/v2\/comments?post=1229"}]}}