{"id":1964,"date":"2010-07-13T16:54:06","date_gmt":"2010-07-13T20:54:06","guid":{"rendered":"https:\/\/wpmu2.mit.local\/?p=1964"},"modified":"2010-07-13T16:54:06","modified_gmt":"2010-07-13T20:54:06","slug":"nano-enabled-cold-cathodes-for-high-frequency-vacuum-amplifiers","status":"publish","type":"post","link":"https:\/\/wpmu2.mit.local\/nano-enabled-cold-cathodes-for-high-frequency-vacuum-amplifiers\/","title":{"rendered":"Nano-enabled Cold Cathodes for High-Frequency Vacuum Amplifiers"},"content":{"rendered":"

The continued demand for very wideband communications and the increased need for wireless channel capacity have led to the exploration of new regions of operation.\u00a0 In particular, the broad minimum in atmospheric absorption that occurs between 200GHz and 300 GHz is largely under-utilized because of a lack of high-bandwidth and high-power amplifiers in this frequency range that are compact and efficient.\u00a0 The core of the vacuum amplifier technology that we propose is a field-emitter-array (FEA) cathode that implements individual emitter ballasting to mitigate the effects of the emitter tip radii spread in the performance of the cathode.\u00a0 Specifically, emission currents are extremely sensitive to tip radii variation due to the exponential dependence of the emitted current on the tip radius of the emitter [1<\/a>]<\/sup>. Unfortunately, tip radii distribution in FEAs has long tails [2<\/a>]<\/sup>.\u00a0 By limiting the current from each emitter, it is possible to prevent destructive emission from the sharper tips while allowing higher overall current emission because of the emission of the duller tips.\u00a0 Ungated FETs are ideal to individually ballast each emitter because they behave like current sources and can be fabricated with high emitter density FEAs [3<\/a>]<\/sup>.\u00a0 We have developed the technology for massive FEAs that are individually ballasted using vertical ungated FETs (Figure 1). We have demonstrated fully-controlled electron emission with currents as high as 0.6 A and with no damage to the cathode (Figure 2).<\/p>\n\n\t\t